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October 3, 2007:
Invantest, Inc has released a new version of the Integrator Station
Controller for wafer test systems. Integrator 2007
includes many new features such as Bin Quality checking,
Retest Pass Sampling, Sample Sub-pass Retest, Macro/Micro
Stepping and Multi-Die retest all touchable die.
For more information please contact us at
support@invantest.com
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