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October 3, 2007:
Invantest, Inc has released a new version of the Integrator Station Controller for wafer test systems. Integrator 2007 includes many new features such as Bin Quality checking, Retest Pass Sampling, Sample Sub-pass Retest, Macro/Micro Stepping and Multi-Die retest all touchable die.
For more information please contact us at support@invantest.com
 

Invantest is the leading supplier of test floor station controllers. We pioneered the use of real-time controllers for test and continue to bring advanced test methodolgies and lower testing costs to test floors around the world.  Explore the Invantest product line and see what we can do to reduce your cost of test.
  Improve Cycle Time
 

Test Floor Automation: Eliminate manual operations, reduce human errors
Intelligent Test Methodologies reduce overall test time

  Improve Process Control: Reduce Yield Loss
  Real-time bin and yield monitoring
Programmable corrective actions
  Improve Automation: Data Quality and Interface
 
Easily customized w/ EVRtoolkit (API)
Interfaces to Yield Management Systems and MES
  Technology leader
 
Deployed on over 70 mixed signal, microprocessor and ASIC test floors globally
In tune with industry trends – partnership with leading IDMs, major tester and prober companies

 

 
   
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