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Invantest, Inc.
pioneered the use of automatic test cell controllers for semiconductor testing and continues to be the market leader for this technology

Invantest controllers enable its customers to maximize the efficiency of their test equipment  to realize the highest possible financial returns on their equipment purchases.

Invantest’s proven cell controller technology is in use at over 75 production test sites around the world.

Invantest’s cell controllers include a standard applications interface for seamless integration within the existing software infrastructure of its customers.

From its many years of experience providing innovative solutions for the production problems and challenges encountered by its customers, Invantest offers an extensive portfolio of proven solutions and best practices.

Realize the benefits from your partnership with Invantest

Contact us at sales@invantest.com

   

Realize the benefits from our complete line of test cell controllers for wafer test, laser trim, and final package testing:

 
Improve Cycle Time
 
   Automate manual operations
   Optimize manufacturing operations
   Apply best practices automatically

  Optimize Process Controls
 
   Pre-defined, real-time monitors enable early fault detection
   Pre-defined controls keep processes in control at all times
   Automatically triggered alarms stop the tester when out of control

  Maximize the Efficiency of the Manufacturing Process
 
   Automatically perform retest during first pass
   Automatically retest only recoverable rejects
   Automatically search for optimum probe contacting
   Automatically capture hidden production losses
   Automatically trigger test hardware cleaning and maintenance
   Apply optimum die stepping algorithms for multi-site testing
   Apply adaptive test techniques
   Apply proven, multi-pass KGD strategies for testing wafers for advanced, stacked-die packages

  Standardize Operations Across All Types of Test Equipment
 
   Universal operator interface
   Standard test processes
   Standard test data formats
   
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