Navigator Plus is a test floor monitor and data retrieval system
within Invantest's YieldLink network environment. Navigator
Plus provides the benefits of off-line setup editing, a real-time
test cell status monitor and a viewer for single and composite
wafer maps and summary reports.
Off-line Setup Editor
Navigator Plus enables preparation of off-line equipment
setups, leaving testers and probers to work with minimal
interruption between lots.
The centralized setup file
storage supplies consistent setup recipes and control
maps to all systems on the floor.
Edit setups and control
maps for TEL, Accretech (TSK) and Electroglas probers.
Files are then available for download through any Integrator
controller.
Point-and-click Control
Map editor gives you the ability to specify special die,
such as Ink Only, Skip, Skip-Don't Touch, Special Test
and Sample Die.
Unique Layout tools allow you to exactly
match the map to the physical wafer.
"Global editing" allows the
same edits to be made to multiple files in one step.
Setups are saved once per floor and distributed over the network
Changes to setups are recorded for traceability
View test results
Color maps can be overlaid with other text layers,
such as hard bins, soft bins, numbers of times each
die was contacted, or which multi-die test site was
used for each die, providing access to a full range
of yield and process data.
View Composite (Stacked) maps to expose
location-based defect trends across lots.
Print bin summary reports for wafers
or lots. Even print maps in color or B/W.
View the entire testing history for
a wafer from one file.
Check System Status
See the current status of any system on the entire
test floor from a central application. This keeps operators,
engineers and management informed of problems on the
test floor.
