Integrator for Final Test is an active real-time test cell controller that makes test-floor automation a reality. It directly incorporates core technologies from Integrator for Wafer Test which is production-proven worldwide since 1994.
Integrator/FT operates with most testers and handlers in the market today and enables consistent operations and test outputs. For the first time, all the equipment on your final test floor will have identical operating procedures, regardless of underlying tester/handler platforms.
Integrator/FT is a unique and cost-effective solution to reduce overall Cost-of-Test in test floors by higher level of process automation, closed-loop test process control with real-time monitoring, unprecedented level of standardization across equipment platforms and conformance to industry standards.
Issues at a typical Final Test
floor
A single most prominent issue at test floors all over the world is the rising Cost-of-Test. Some of the evident characteristics in running a semiconductor test floor are the prerequisite high level of investment in capital equipment and facilities, rising cost of equipment to cope with shortening product life cycles, and ever increasing pressure from customers for lower test cost. Yet demand for test service itself is highly susceptible to unpredictable industry cycles, often resulting in idling of expensive equipment.
Solutions
Facing the above challenges, it is easy to see that achieving the maximum efficiency in test cell & floor operations should be the goal to survive and flourish in this industry.
It’s long been recognized that the test industry is in dire need of data / operational standards and a higher level of automation, not currently available. A highly intelligent software cell controller is the core element in any high-performance test floor – wafer probe or final test.
Integrator/FT is Invantest’s answer to these needs.
Key Benefits and Features
New solution based on production-proven technologies in wafer test floors since 1994.
Demonstrable Return-on-Investment (ROI) from an increase in OEE
"Standardization-in-a-Box" for human interaction, process monitor/control and results output, across diverse equipment platforms
Unprecedented level of accuracy, automation and timeliness of test cell data collection for True OEE and Operational Visibility.
Advanced Bin and Yield Monitoring across products and equipment platforms.
Early Fault Detection to optimize Production efficiency
High level of automation to enforce use of a Golden Setup and reduce human mistakes.
Built-in Customizability to allow rapid site customizations by customers.
Inter-site data and operational standardization for enforcing industry Best Practices.
Compatibility with Integrator Wafer Test for total process standardization on mixed test floors
Inline Retest with saving time from eliminating a
secondary retest pass as an independent pass has
significant operational overhead involving human
operators
